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Debug automation from pre-silicon to post-silicon
This book describes automated debugging approaches for the bugs and the faults which appear in different abstraction levels of a hardware system. The authors employ a transaction-based debug approach to systems at the transaction-level, asserting the correct relation of transactions. The automated d...
Autores principales: | Dehbashi, Mehdi, Fey, Görschwin |
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Lenguaje: | eng |
Publicado: |
Springer
2015
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Materias: | |
Acceso en línea: | https://dx.doi.org/10.1007/978-3-319-09309-3 http://cds.cern.ch/record/1968673 |
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