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Fundamentals of lead-free solder interconnect technology: from microstructures to reliability

This unique book provides an up-to-date overview of the fundamental concepts behind lead-free solder and interconnection technology. Readers will find a description of the rapidly increasing presence of electronic systems in all aspects of modern life as well as the increasing need for predictable r...

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Detalles Bibliográficos
Autores principales: Lee, Tae-Kyu, Bieler, Thomas R, Kim, Choong-Un, Ma, Hongtao
Lenguaje:eng
Publicado: Springer 2015
Materias:
Acceso en línea:https://dx.doi.org/10.1007/978-1-4614-9266-5
http://cds.cern.ch/record/1973458
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author Lee, Tae-Kyu
Bieler, Thomas R
Kim, Choong-Un
Ma, Hongtao
author_facet Lee, Tae-Kyu
Bieler, Thomas R
Kim, Choong-Un
Ma, Hongtao
author_sort Lee, Tae-Kyu
collection CERN
description This unique book provides an up-to-date overview of the fundamental concepts behind lead-free solder and interconnection technology. Readers will find a description of the rapidly increasing presence of electronic systems in all aspects of modern life as well as the increasing need for predictable reliability in electronic systems. The physical and mechanical properties of lead-free solders are examined in detail, and building on fundamental science, the mechanisms responsible for damage and failure evolution, which affect reliability of lead-free solder joints are identified based on microstructure evolution.  The continuing miniaturization of electronic systems will increase the demand on the performance of solder joints, which will require new alloy and processing strategies as well as interconnection design strategies. This book provides a foundation on which improved performance and new design approaches can be based.  In summary, this book:  Provides an up-to-date overview on lead-free soldering technologies   Covers the fundamentals, implementation, reliability, challenges and risks of lead-free soldering technique Explores emerging technologies in lead-free soldering
id cern-1973458
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2015
publisher Springer
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spelling cern-19734582021-04-21T20:41:57Zdoi:10.1007/978-1-4614-9266-5http://cds.cern.ch/record/1973458engLee, Tae-KyuBieler, Thomas RKim, Choong-UnMa, HongtaoFundamentals of lead-free solder interconnect technology: from microstructures to reliabilityEngineeringThis unique book provides an up-to-date overview of the fundamental concepts behind lead-free solder and interconnection technology. Readers will find a description of the rapidly increasing presence of electronic systems in all aspects of modern life as well as the increasing need for predictable reliability in electronic systems. The physical and mechanical properties of lead-free solders are examined in detail, and building on fundamental science, the mechanisms responsible for damage and failure evolution, which affect reliability of lead-free solder joints are identified based on microstructure evolution.  The continuing miniaturization of electronic systems will increase the demand on the performance of solder joints, which will require new alloy and processing strategies as well as interconnection design strategies. This book provides a foundation on which improved performance and new design approaches can be based.  In summary, this book:  Provides an up-to-date overview on lead-free soldering technologies   Covers the fundamentals, implementation, reliability, challenges and risks of lead-free soldering technique Explores emerging technologies in lead-free solderingSpringeroai:cds.cern.ch:19734582015
spellingShingle Engineering
Lee, Tae-Kyu
Bieler, Thomas R
Kim, Choong-Un
Ma, Hongtao
Fundamentals of lead-free solder interconnect technology: from microstructures to reliability
title Fundamentals of lead-free solder interconnect technology: from microstructures to reliability
title_full Fundamentals of lead-free solder interconnect technology: from microstructures to reliability
title_fullStr Fundamentals of lead-free solder interconnect technology: from microstructures to reliability
title_full_unstemmed Fundamentals of lead-free solder interconnect technology: from microstructures to reliability
title_short Fundamentals of lead-free solder interconnect technology: from microstructures to reliability
title_sort fundamentals of lead-free solder interconnect technology: from microstructures to reliability
topic Engineering
url https://dx.doi.org/10.1007/978-1-4614-9266-5
http://cds.cern.ch/record/1973458
work_keys_str_mv AT leetaekyu fundamentalsofleadfreesolderinterconnecttechnologyfrommicrostructurestoreliability
AT bielerthomasr fundamentalsofleadfreesolderinterconnecttechnologyfrommicrostructurestoreliability
AT kimchoongun fundamentalsofleadfreesolderinterconnecttechnologyfrommicrostructurestoreliability
AT mahongtao fundamentalsofleadfreesolderinterconnecttechnologyfrommicrostructurestoreliability