Measurements of degradation of silicon detectors and electronics in various radiation environments

Detalles Bibliográficos
Autores principales: Beuville, E, Cenci, P, Federspiel, A, Gössling, C, Heijne, Erik H M, Jarron, Pierre, Kraner, H W, Massam, Thomas, Munday, D J, Pal, T
Lenguaje:eng
Publicado: 1989
Materias:
Detectors and Experimental Techniques
Acceso en línea:https://dx.doi.org/10.1016/0168-9002(90)90465-I
http://cds.cern.ch/record/197457

Internet

https://dx.doi.org/10.1016/0168-9002(90)90465-I
http://cds.cern.ch/record/197457

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