CMOS test and evaluation: a physical perspective

This book extends test structure applications described in Microelectronic Test Struc­tures for CMOS Technology (Springer 2011) to digital CMOS product chips. Intended for engineering students and professionals, this book provides a single comprehensive source for evaluating CMOS technology and prod...

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Detalles Bibliográficos
Autores principales: Bhushan, Manjul, Ketchen, Mark B
Lenguaje:eng
Publicado: Springer 2015
Materias:
Engineering
Acceso en línea:https://dx.doi.org/10.1007/978-1-4939-1349-7
http://cds.cern.ch/record/1980505

Internet

https://dx.doi.org/10.1007/978-1-4939-1349-7
http://cds.cern.ch/record/1980505

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