Cargando…
CMOS test and evaluation: a physical perspective
This book extends test structure applications described in Microelectronic Test Structures for CMOS Technology (Springer 2011) to digital CMOS product chips. Intended for engineering students and professionals, this book provides a single comprehensive source for evaluating CMOS technology and prod...
| Autores principales: | , |
|---|---|
| Lenguaje: | eng |
| Publicado: |
Springer
2015
|
| Materias: | |
| Acceso en línea: | https://dx.doi.org/10.1007/978-1-4939-1349-7 http://cds.cern.ch/record/1980505 |