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Hot-carrier effects in MOS devices

The exploding number of uses for ultrafast, ultrasmall integrated circuits has increased the importance of hot-carrier effects in manufacturing as well as for other technological applications. They are rapidly movingout of the research lab and into the real world.This book is derived from Dr. Takeda...

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Detalles Bibliográficos
Autores principales: Takeda, Eiji, Yang, Cary Y, Miura-Hamada, Akemi
Lenguaje:eng
Publicado: Academic Press 1995
Materias:
Acceso en línea:http://cds.cern.ch/record/1985509