Testing for small-delay defects in nanoscale CMOS integrated circuits

Detalles Bibliográficos
Autores principales: Goel, Sandeep K, Chakrabarty, Krishnendu
Lenguaje:eng
Publicado: CRC Press 2014
Materias:
Engineering
Acceso en línea:http://cds.cern.ch/record/1988883
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author Goel, Sandeep K
Chakrabarty, Krishnendu
author_facet Goel, Sandeep K
Chakrabarty, Krishnendu
author_sort Goel, Sandeep K
collection CERN
id cern-1988883
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2014
publisher CRC Press
record_format invenio
spelling cern-19888832021-04-21T20:32:23Zhttp://cds.cern.ch/record/1988883engGoel, Sandeep KChakrabarty, Krishnendu Testing for small-delay defects in nanoscale CMOS integrated circuits EngineeringCRC Pressoai:cds.cern.ch:19888832014
spellingShingle Engineering
Goel, Sandeep K
Chakrabarty, Krishnendu
Testing for small-delay defects in nanoscale CMOS integrated circuits
title Testing for small-delay defects in nanoscale CMOS integrated circuits
title_full Testing for small-delay defects in nanoscale CMOS integrated circuits
title_fullStr Testing for small-delay defects in nanoscale CMOS integrated circuits
title_full_unstemmed Testing for small-delay defects in nanoscale CMOS integrated circuits
title_short Testing for small-delay defects in nanoscale CMOS integrated circuits
title_sort testing for small-delay defects in nanoscale cmos integrated circuits
topic Engineering
url http://cds.cern.ch/record/1988883
work_keys_str_mv AT goelsandeepk testingforsmalldelaydefectsinnanoscalecmosintegratedcircuits
AT chakrabartykrishnendu testingforsmalldelaydefectsinnanoscalecmosintegratedcircuits

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