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Testing for small-delay defects in nanoscale CMOS integrated circuits

Detalles Bibliográficos
Autores principales:	Goel, Sandeep K, Chakrabarty, Krishnendu
Lenguaje:	eng
Publicado:	CRC Press 2014
Materias:	Engineering
Acceso en línea:	http://cds.cern.ch/record/1988883

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