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2nd International Conference on Ion Implantation in Semiconductors, Physics and Technology, Fundamental and Applied Aspects

In recent years great progress has been made in the field of ion implantation, particularly with respect to applications in semiconductors. It would be impos­ sible not to note the growing interest in this field, both by research groups and those directly concerned with production of devices. Furthe...

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Detalles Bibliográficos
Autores principales: Ruge, Ingolf, Graul, Jürgen
Lenguaje:eng
Publicado: Springer 1971
Materias:
Acceso en línea:https://dx.doi.org/10.1007/978-3-642-80660-5
http://cds.cern.ch/record/2007753
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author Ruge, Ingolf
Graul, Jürgen
author_facet Ruge, Ingolf
Graul, Jürgen
author_sort Ruge, Ingolf
collection CERN
description In recent years great progress has been made in the field of ion implantation, particularly with respect to applications in semiconductors. It would be impos­ sible not to note the growing interest in this field, both by research groups and those directly concerned with production of devices. Furthermore, as several papers have pointed out, ion implantation and its associated technologies promise exciting advances in the development of new kinds of devices and provide power­ ful new tools for materials investigations. It was, therefore, appropriate to arrange the II. International Conference on Ion Implantation in Semiconductors within the rather short time of one year since the first conference was held in 1970 in Thousand Oaks, California. Although ori­ ginally planned on a small scale with a very limited number of participants, more than two hundred scientists from 15 countries participated in the Conference which was held May 24 - 28, 1971 at the Congress Center in Garmisch-Partenkirchen. This volume contains the papers that were presented at the Conference. Due to the tremendous volume of research presented, publication here of all the works in full detail was not possible. Many authors therefore graciously agreed to submit abbreviated versions of their papers.
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spelling cern-20077532021-04-22T06:57:01Zdoi:10.1007/978-3-642-80660-5http://cds.cern.ch/record/2007753engRuge, IngolfGraul, Jürgen2nd International Conference on Ion Implantation in Semiconductors, Physics and Technology, Fundamental and Applied AspectsParticle Physics - ExperimentIn recent years great progress has been made in the field of ion implantation, particularly with respect to applications in semiconductors. It would be impos­ sible not to note the growing interest in this field, both by research groups and those directly concerned with production of devices. Furthermore, as several papers have pointed out, ion implantation and its associated technologies promise exciting advances in the development of new kinds of devices and provide power­ ful new tools for materials investigations. It was, therefore, appropriate to arrange the II. International Conference on Ion Implantation in Semiconductors within the rather short time of one year since the first conference was held in 1970 in Thousand Oaks, California. Although ori­ ginally planned on a small scale with a very limited number of participants, more than two hundred scientists from 15 countries participated in the Conference which was held May 24 - 28, 1971 at the Congress Center in Garmisch-Partenkirchen. This volume contains the papers that were presented at the Conference. Due to the tremendous volume of research presented, publication here of all the works in full detail was not possible. Many authors therefore graciously agreed to submit abbreviated versions of their papers.Springeroai:cds.cern.ch:20077531971
spellingShingle Particle Physics - Experiment
Ruge, Ingolf
Graul, Jürgen
2nd International Conference on Ion Implantation in Semiconductors, Physics and Technology, Fundamental and Applied Aspects
title 2nd International Conference on Ion Implantation in Semiconductors, Physics and Technology, Fundamental and Applied Aspects
title_full 2nd International Conference on Ion Implantation in Semiconductors, Physics and Technology, Fundamental and Applied Aspects
title_fullStr 2nd International Conference on Ion Implantation in Semiconductors, Physics and Technology, Fundamental and Applied Aspects
title_full_unstemmed 2nd International Conference on Ion Implantation in Semiconductors, Physics and Technology, Fundamental and Applied Aspects
title_short 2nd International Conference on Ion Implantation in Semiconductors, Physics and Technology, Fundamental and Applied Aspects
title_sort 2nd international conference on ion implantation in semiconductors, physics and technology, fundamental and applied aspects
topic Particle Physics - Experiment
url https://dx.doi.org/10.1007/978-3-642-80660-5
http://cds.cern.ch/record/2007753
work_keys_str_mv AT rugeingolf 2ndinternationalconferenceonionimplantationinsemiconductorsphysicsandtechnologyfundamentalandappliedaspects
AT grauljurgen 2ndinternationalconferenceonionimplantationinsemiconductorsphysicsandtechnologyfundamentalandappliedaspects