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Advanced computing in electron microscopy

This book features numerical computation of electron microscopy images as well as multislice methods High resolution CTEM and STEM image interpretation are included in the text This newly updated second edition will bring the reader up to date on new developments in the field since the 1990's T...

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Detalles Bibliográficos
Autor principal: Kirkland, Earl J
Lenguaje:eng
Publicado: Springer 2010
Materias:
Acceso en línea:https://dx.doi.org/10.1007/978-1-4419-6533-2
http://cds.cern.ch/record/2009647