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Advanced computing in electron microscopy
This book features numerical computation of electron microscopy images as well as multislice methods High resolution CTEM and STEM image interpretation are included in the text This newly updated second edition will bring the reader up to date on new developments in the field since the 1990's T...
Autor principal: | Kirkland, Earl J |
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Lenguaje: | eng |
Publicado: |
Springer
2010
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Materias: | |
Acceso en línea: | https://dx.doi.org/10.1007/978-1-4419-6533-2 http://cds.cern.ch/record/2009647 |
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