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Lifetime spectroscopy: a method of defect characterization in silicon for photovoltaic applications
Lifetime spectroscopy is one of the most sensitive diagnostic tools for the identification and analysis of impurities in semiconductors. Since it is based on the recombination process, it provides insight into precisely those defects that are relevant to semiconductor devices such as solar cells. Th...
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| Lenguaje: | eng |
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Springer
2005
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| Acceso en línea: | https://dx.doi.org/10.1007/3-540-27922-9 http://cds.cern.ch/record/2023354 |