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Trapping in irradiated p-on-n silicon sensors at fluences anticipated at the HL-LHC outer tracker

The degradation of signal in silicon sensors is studied under conditions expected at the CERN High-Luminosity LHC. 200~$\mu$m thick n-type silicon sensors are irradiated with protons of different energies to fluences of up to $3 \cdot 10^{15}$~neq/cm$^2$. Pulsed red laser light with a wavelength of...

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Detalles Bibliográficos
Autores principales: Pohlsen, Thomas, Eckhart Fretwurst, Garutti, Erika, Junkes, Alexandra, Steinbrueck, Georg
Lenguaje:eng
Publicado: 2014
Materias:
Acceso en línea:http://cds.cern.ch/record/2026854