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Error estimation for pattern recognition
This book is the first of its kind to discuss error estimation with a model-based approach. From the basics of classifiers and error estimators to more specialized classifiers, it covers important topics and essential issues pertaining to the scientific validity of pattern classification. Addition...
Autores principales: | , |
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Lenguaje: | eng |
Publicado: |
Wiley-IEEE Press
2015
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Materias: | |
Acceso en línea: | http://cds.cern.ch/record/2051911 |