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Metrological Characterization of an Ultra-low Noise Acquisition System for Fast Voltage Pulses Measurements
The metrological characterization of a custom designed ultra-low noise analogue front-end for an acquisition system for the measurement of flat-top of fast voltage pulses is presented. The system has challenging r quirements, in particular for Common Mode Rejection Ratio (C M RR), thus custom method...
| Autores principales: | , , |
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| Lenguaje: | eng |
| Publicado: |
2015
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| Materias: | |
| Acceso en línea: | https://dx.doi.org/10.1109/I2MTC.2015.7151506 http://cds.cern.ch/record/2058273 |