Metrological Characterization of an Ultra-low Noise Acquisition System for Fast Voltage Pulses Measurements

The metrological characterization of a custom designed ultra-low noise analogue front-end for an acquisition system for the measurement of flat-top of fast voltage pulses is presented. The system has challenging r quirements, in particular for Common Mode Rejection Ratio (C M RR), thus custom method...

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Detalles Bibliográficos
Autores principales: Baccigalupi, Carlo, Arpaia, Pasquale, Martino, Michele
Lenguaje:eng
Publicado: 2015
Materias:
Engineering
Acceso en línea:https://dx.doi.org/10.1109/I2MTC.2015.7151506
http://cds.cern.ch/record/2058273
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author Baccigalupi, Carlo
Arpaia, Pasquale
Martino, Michele
author_facet Baccigalupi, Carlo
Arpaia, Pasquale
Martino, Michele
author_sort Baccigalupi, Carlo
collection CERN
description The metrological characterization of a custom designed ultra-low noise analogue front-end for an acquisition system for the measurement of flat-top of fast voltage pulses is presented. The system has challenging r quirements, in particular for Common Mode Rejection Ratio (C M RR), thus custom methods have been defined, by illustrating the experimental results achieved at the European Organization for Nuclear Research (CERN) during the study of the new Compact LInear Collider (CLIC).
id cern-2058273
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2015
record_format invenio
spelling cern-20582732019-09-30T06:29:59Zdoi:10.1109/I2MTC.2015.7151506http://cds.cern.ch/record/2058273engBaccigalupi, CarloArpaia, PasqualeMartino, MicheleMetrological Characterization of an Ultra-low Noise Acquisition System for Fast Voltage Pulses MeasurementsEngineeringThe metrological characterization of a custom designed ultra-low noise analogue front-end for an acquisition system for the measurement of flat-top of fast voltage pulses is presented. The system has challenging r quirements, in particular for Common Mode Rejection Ratio (C M RR), thus custom methods have been defined, by illustrating the experimental results achieved at the European Organization for Nuclear Research (CERN) during the study of the new Compact LInear Collider (CLIC).CERN-ACC-2015-0120oai:cds.cern.ch:20582732015-10-09
spellingShingle Engineering
Baccigalupi, Carlo
Arpaia, Pasquale
Martino, Michele
Metrological Characterization of an Ultra-low Noise Acquisition System for Fast Voltage Pulses Measurements
title Metrological Characterization of an Ultra-low Noise Acquisition System for Fast Voltage Pulses Measurements
title_full Metrological Characterization of an Ultra-low Noise Acquisition System for Fast Voltage Pulses Measurements
title_fullStr Metrological Characterization of an Ultra-low Noise Acquisition System for Fast Voltage Pulses Measurements
title_full_unstemmed Metrological Characterization of an Ultra-low Noise Acquisition System for Fast Voltage Pulses Measurements
title_short Metrological Characterization of an Ultra-low Noise Acquisition System for Fast Voltage Pulses Measurements
title_sort metrological characterization of an ultra-low noise acquisition system for fast voltage pulses measurements
topic Engineering
url https://dx.doi.org/10.1109/I2MTC.2015.7151506
http://cds.cern.ch/record/2058273
work_keys_str_mv AT baccigalupicarlo metrologicalcharacterizationofanultralownoiseacquisitionsystemforfastvoltagepulsesmeasurements
AT arpaiapasquale metrologicalcharacterizationofanultralownoiseacquisitionsystemforfastvoltagepulsesmeasurements
AT martinomichele metrologicalcharacterizationofanultralownoiseacquisitionsystemforfastvoltagepulsesmeasurements

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