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Test and diagnosis of analogue, mixed-signal and RF integrated circuits: the system on chip approach
This book provides a comprehensive discussion of automatic testing, diagnosis and tuning of analogue, mixed-signal and RF integrated circuits, and systems in a single source. The book contains eleven chapters written by leading researchers worldwide. As well as fundamental concepts and techniques, t...
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| Lenguaje: | eng |
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The Institution of Engineering and Technology
2008
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| Acceso en línea: | http://cds.cern.ch/record/2066427 |