Test and diagnosis of analogue, mixed-signal and RF integrated circuits: the system on chip approach

This book provides a comprehensive discussion of automatic testing, diagnosis and tuning of analogue, mixed-signal and RF integrated circuits, and systems in a single source. The book contains eleven chapters written by leading researchers worldwide. As well as fundamental concepts and techniques, t...

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Detalles Bibliográficos
Autor principal: Sun, Yichuang
Lenguaje:eng
Publicado: The Institution of Engineering and Technology 2008
Materias:
Engineering
Acceso en línea:http://cds.cern.ch/record/2066427
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author Sun, Yichuang
author_facet Sun, Yichuang
author_sort Sun, Yichuang
collection CERN
description This book provides a comprehensive discussion of automatic testing, diagnosis and tuning of analogue, mixed-signal and RF integrated circuits, and systems in a single source. The book contains eleven chapters written by leading researchers worldwide. As well as fundamental concepts and techniques, the book reports systematically the state of the arts and future research directions of these areas. A complete range of circuit components are covered and test issues are also addressed from the SoC perspective.
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institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2008
publisher The Institution of Engineering and Technology
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spelling cern-20664272021-04-21T20:02:56Zhttp://cds.cern.ch/record/2066427engSun, YichuangTest and diagnosis of analogue, mixed-signal and RF integrated circuits: the system on chip approachEngineeringThis book provides a comprehensive discussion of automatic testing, diagnosis and tuning of analogue, mixed-signal and RF integrated circuits, and systems in a single source. The book contains eleven chapters written by leading researchers worldwide. As well as fundamental concepts and techniques, the book reports systematically the state of the arts and future research directions of these areas. A complete range of circuit components are covered and test issues are also addressed from the SoC perspective.The Institution of Engineering and Technologyoai:cds.cern.ch:20664272008
spellingShingle Engineering
Sun, Yichuang
Test and diagnosis of analogue, mixed-signal and RF integrated circuits: the system on chip approach
title Test and diagnosis of analogue, mixed-signal and RF integrated circuits: the system on chip approach
title_full Test and diagnosis of analogue, mixed-signal and RF integrated circuits: the system on chip approach
title_fullStr Test and diagnosis of analogue, mixed-signal and RF integrated circuits: the system on chip approach
title_full_unstemmed Test and diagnosis of analogue, mixed-signal and RF integrated circuits: the system on chip approach
title_short Test and diagnosis of analogue, mixed-signal and RF integrated circuits: the system on chip approach
title_sort test and diagnosis of analogue, mixed-signal and rf integrated circuits: the system on chip approach
topic Engineering
url http://cds.cern.ch/record/2066427
work_keys_str_mv AT sunyichuang testanddiagnosisofanaloguemixedsignalandrfintegratedcircuitsthesystemonchipapproach

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