Cargando…
Modelling The Eect of Radiation Damage in Silicon Detectors
Within the topic of radiation damage on silicon detectors, a general description of the main effects of such phenomenon is provided, and a first implementation of fluence dependent trapping in the simulation program Weighteld 2 is proposed, along with a discussion of the limitations of the current...
| Autor principal: | |
|---|---|
| Lenguaje: | eng |
| Publicado: |
2015
|
| Materias: | |
| Acceso en línea: | http://cds.cern.ch/record/2066958 |