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Design for manufacturability with advanced lithography

This book introduces readers to the most advanced research results on Design for Manufacturability (DFM) with multiple patterning lithography (MPL) and electron beam lithography (EBL).  The authors describe in detail a set of algorithms/methodologies to resolve issues in modern design for manufactur...

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Detalles Bibliográficos
Autores principales: Yu, Bei, Pan, David Z
Lenguaje:eng
Publicado: Springer 2016
Materias:
Acceso en línea:https://dx.doi.org/10.1007/978-3-319-20385-0
http://cds.cern.ch/record/2112749