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Measurements of secondary particles emitted by $^{12}$C, $^{4}$He and $^{16}$O ion beams in view of innovative dose profiling technique in Particle Therapy

Detalles Bibliográficos
Autores principales: Rucinski, A, Battistoni, G, Collamati, F, De Lucia, E, Faccini, R, Marafini, M, Mattei, I, Muraro, S, Paramatti, R, Patera, V, Pinci, D, Russomando, A, Sarti, A, Sciubba, A, Solfaroli Camillocci, E, Toppi, M, Traini, G, Voena, C
Lenguaje:eng
Publicado: 2015
Materias:
Acceso en línea:http://cds.cern.ch/record/2115402