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Measurements of secondary particles emitted by $^{12}$C, $^{4}$He and $^{16}$O ion beams in view of innovative dose profiling technique in Particle Therapy
Autores principales: | , , , , , , , , , , , , , , , , , |
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Lenguaje: | eng |
Publicado: |
2015
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Materias: | |
Acceso en línea: | http://cds.cern.ch/record/2115402 |