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Effectiveness Analysis of a Non-Destructive Single Event Burnout Test Methodology
It is essential to characterize power MosFETs regarding their tolerance to destructive Single Event Burnouts (SEB). Therefore, several non-destructive test methods have been developed to evaluate the SEB cross-section of power devices. A power MosFET has been evaluated using a test circuit, designed...
| Autores principales: | , , , , , , , |
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| Lenguaje: | eng |
| Publicado: |
2014
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| Materias: | |
| Acceso en línea: | https://dx.doi.org/10.1109/TNS.2014.2320292 http://cds.cern.ch/record/2124627 |