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Defects and impurities in silicon materials: an introduction to atomic-level silicon engineering

This book emphasizes the importance of the fascinating atomistic insights into the defects and the impurities as well as the dynamic behaviors in silicon materials, which have become more directly accessible over the past 20 years. Such progress has been made possible by newly developed experimental...

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Detalles Bibliográficos
Autores principales: Yoshida, Yutaka, Langouche, Guido
Lenguaje:eng
Publicado: Springer 2015
Materias:
Acceso en línea:https://dx.doi.org/10.1007/978-4-431-55800-2
http://cds.cern.ch/record/2143612