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Trace-based post-silicon validation for VLSI circuits

This book first provides a comprehensive coverage of state-of-the-art validation solutions based on real-time signal tracing to guarantee the correctness of VLSI circuits.  The authors discuss several key challenges in post-silicon validation and provide automated solutions that are systematic and c...

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Detalles Bibliográficos
Autores principales: Liu, Xiao, Xu, Qiang
Lenguaje:eng
Publicado: Springer 2014
Materias:
Acceso en línea:https://dx.doi.org/10.1007/978-3-319-00533-1
http://cds.cern.ch/record/2146578