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Trace-based post-silicon validation for VLSI circuits
This book first provides a comprehensive coverage of state-of-the-art validation solutions based on real-time signal tracing to guarantee the correctness of VLSI circuits. The authors discuss several key challenges in post-silicon validation and provide automated solutions that are systematic and c...
Autores principales: | Liu, Xiao, Xu, Qiang |
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Lenguaje: | eng |
Publicado: |
Springer
2014
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Materias: | |
Acceso en línea: | https://dx.doi.org/10.1007/978-3-319-00533-1 http://cds.cern.ch/record/2146578 |
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