Investigation on MCU Clustering Methodologies for Cross-Section Estimation of RAMs

During irradiation testing of RAMs, various failure scenarios may occur which may generate different characteristic Multiple Cell Upset (MCU) error patterns. This work proposes a method based on spatial and temporal criteria to identify them.

Detalles Bibliográficos
Autores principales: Bosser, A, Gupta, V, Tsiligiannis, G, Javanainen, A, Kettunen, H, Puchner, H, Saigne, F, Virtanen, A, Wrobel, F, Dilillo, L
Lenguaje:eng
Publicado: 2015
Materias:
Engineering
Acceso en línea:https://dx.doi.org/10.1109/TNS.2015.2496874
http://cds.cern.ch/record/2161042

Internet

https://dx.doi.org/10.1109/TNS.2015.2496874
http://cds.cern.ch/record/2161042

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