Investigation on MCU Clustering Methodologies for Cross-Section Estimation of RAMs

During irradiation testing of RAMs, various failure scenarios may occur which may generate different characteristic Multiple Cell Upset (MCU) error patterns. This work proposes a method based on spatial and temporal criteria to identify them.

Detalles Bibliográficos
Autores principales: Bosser, A, Gupta, V, Tsiligiannis, G, Javanainen, A, Kettunen, H, Puchner, H, Saigne, F, Virtanen, A, Wrobel, F, Dilillo, L
Lenguaje:eng
Publicado: 2015
Materias:
Engineering
Acceso en línea:https://dx.doi.org/10.1109/TNS.2015.2496874
http://cds.cern.ch/record/2161042
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author Bosser, A
Gupta, V
Tsiligiannis, G
Javanainen, A
Kettunen, H
Puchner, H
Saigne, F
Virtanen, A
Wrobel, F
Dilillo, L
author_facet Bosser, A
Gupta, V
Tsiligiannis, G
Javanainen, A
Kettunen, H
Puchner, H
Saigne, F
Virtanen, A
Wrobel, F
Dilillo, L
author_sort Bosser, A
collection CERN
description During irradiation testing of RAMs, various failure scenarios may occur which may generate different characteristic Multiple Cell Upset (MCU) error patterns. This work proposes a method based on spatial and temporal criteria to identify them.
id cern-2161042
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2015
record_format invenio
spelling cern-21610422019-09-30T06:29:59Zdoi:10.1109/TNS.2015.2496874http://cds.cern.ch/record/2161042engBosser, AGupta, VTsiligiannis, GJavanainen, AKettunen, HPuchner, HSaigne, FVirtanen, AWrobel, FDilillo, LInvestigation on MCU Clustering Methodologies for Cross-Section Estimation of RAMsEngineeringDuring irradiation testing of RAMs, various failure scenarios may occur which may generate different characteristic Multiple Cell Upset (MCU) error patterns. This work proposes a method based on spatial and temporal criteria to identify them.oai:cds.cern.ch:21610422015
spellingShingle Engineering
Bosser, A
Gupta, V
Tsiligiannis, G
Javanainen, A
Kettunen, H
Puchner, H
Saigne, F
Virtanen, A
Wrobel, F
Dilillo, L
Investigation on MCU Clustering Methodologies for Cross-Section Estimation of RAMs
title Investigation on MCU Clustering Methodologies for Cross-Section Estimation of RAMs
title_full Investigation on MCU Clustering Methodologies for Cross-Section Estimation of RAMs
title_fullStr Investigation on MCU Clustering Methodologies for Cross-Section Estimation of RAMs
title_full_unstemmed Investigation on MCU Clustering Methodologies for Cross-Section Estimation of RAMs
title_short Investigation on MCU Clustering Methodologies for Cross-Section Estimation of RAMs
title_sort investigation on mcu clustering methodologies for cross-section estimation of rams
topic Engineering
url https://dx.doi.org/10.1109/TNS.2015.2496874
http://cds.cern.ch/record/2161042
work_keys_str_mv AT bossera investigationonmcuclusteringmethodologiesforcrosssectionestimationoframs
AT guptav investigationonmcuclusteringmethodologiesforcrosssectionestimationoframs
AT tsiligiannisg investigationonmcuclusteringmethodologiesforcrosssectionestimationoframs
AT javanainena investigationonmcuclusteringmethodologiesforcrosssectionestimationoframs
AT kettunenh investigationonmcuclusteringmethodologiesforcrosssectionestimationoframs
AT puchnerh investigationonmcuclusteringmethodologiesforcrosssectionestimationoframs
AT saignef investigationonmcuclusteringmethodologiesforcrosssectionestimationoframs
AT virtanena investigationonmcuclusteringmethodologiesforcrosssectionestimationoframs
AT wrobelf investigationonmcuclusteringmethodologiesforcrosssectionestimationoframs
AT dilillol investigationonmcuclusteringmethodologiesforcrosssectionestimationoframs

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