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Structural, mechanical and light yield characterisation of heat treated LYSO:Ce single crystals for medical imaging applications

Five single crystals of cerium-doped lutetium yttrium oxyorthosilicate (LYSO:Ce) grown by the Czochralski method were submitted to structural characterisation by X-ray (XRD) and neutron (ND) diffraction, scanning (SEM) and transmission (TEM) electron microscopy and energy dispersive microanalysis (E...

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Detalles Bibliográficos
Autores principales: Mengucci, P, André, G, Auffray, E, Barucca, G, Cecchi, C, Chipaux, R, Cousson, A, Davì, F, Di Vara, N, Rinaldi, D, Santecchia, E
Publicado: 2015
Materias:
XX
Acceso en línea:https://dx.doi.org/10.1016/j.nima.2015.02.061
http://cds.cern.ch/record/2162744