Cargando…
Total Ionization Dose effects in the FE-I4 front-end chip of the ATLAS Pixel IBL detector
During the first year of operation, a drift of the IBL calibration parameters (Threshold and ToT) and a low voltage current increase was observed. It was assumed that both observations were related to radiation damage effects depending on the Total Ionizing Dose (TID) in the NMOS transistors of whic...
| Autor principal: | |
|---|---|
| Lenguaje: | eng |
| Publicado: |
2016
|
| Materias: | |
| Acceso en línea: | http://cds.cern.ch/record/2212253 |
| _version_ | 1780951869254795264 |
|---|---|
| author | ATLAS Pixel Collaboration |
| author_facet | ATLAS Pixel Collaboration |
| author_sort | ATLAS Pixel Collaboration |
| collection | CERN |
| description | During the first year of operation, a drift of the IBL calibration parameters (Threshold and ToT) and a low voltage current increase was observed. It was assumed that both observations were related to radiation damage effects depending on the Total Ionizing Dose (TID) in the NMOS transistors of which each Front End chip holds around 80 million. The effect of radiation on those transistors was investigated in lab measurements and the results will be presented in this talk. |
| id | cern-2212253 |
| institution | Organización Europea para la Investigación Nuclear |
| language | eng |
| publishDate | 2016 |
| record_format | invenio |
| spelling | cern-22122532019-09-30T06:29:59Zhttp://cds.cern.ch/record/2212253engATLAS Pixel CollaborationTotal Ionization Dose effects in the FE-I4 front-end chip of the ATLAS Pixel IBL detectorParticle Physics - ExperimentDuring the first year of operation, a drift of the IBL calibration parameters (Threshold and ToT) and a low voltage current increase was observed. It was assumed that both observations were related to radiation damage effects depending on the Total Ionizing Dose (TID) in the NMOS transistors of which each Front End chip holds around 80 million. The effect of radiation on those transistors was investigated in lab measurements and the results will be presented in this talk.ATL-INDET-SLIDE-2016-562oai:cds.cern.ch:22122532016-09-01 |
| spellingShingle | Particle Physics - Experiment ATLAS Pixel Collaboration Total Ionization Dose effects in the FE-I4 front-end chip of the ATLAS Pixel IBL detector |
| title | Total Ionization Dose effects in the FE-I4 front-end chip of the ATLAS Pixel IBL detector |
| title_full | Total Ionization Dose effects in the FE-I4 front-end chip of the ATLAS Pixel IBL detector |
| title_fullStr | Total Ionization Dose effects in the FE-I4 front-end chip of the ATLAS Pixel IBL detector |
| title_full_unstemmed | Total Ionization Dose effects in the FE-I4 front-end chip of the ATLAS Pixel IBL detector |
| title_short | Total Ionization Dose effects in the FE-I4 front-end chip of the ATLAS Pixel IBL detector |
| title_sort | total ionization dose effects in the fe-i4 front-end chip of the atlas pixel ibl detector |
| topic | Particle Physics - Experiment |
| url | http://cds.cern.ch/record/2212253 |
| work_keys_str_mv | AT atlaspixelcollaboration totalionizationdoseeffectsinthefei4frontendchipoftheatlaspixelibldetector |