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Reliability, robustness and failure mechanisms of LED devices: methodology and evaluation

Detalles Bibliográficos
Autores principales: Deshayes, Yannick, Béchou, Laurent
Lenguaje:eng
Publicado: Elsevier Science 2016
Materias:
XX
Acceso en línea:http://cds.cern.ch/record/2230422