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Reliability, robustness and failure mechanisms of LED devices: methodology and evaluation
| Autores principales: | , |
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| Lenguaje: | eng |
| Publicado: |
Elsevier Science
2016
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| Materias: | |
| Acceso en línea: | http://cds.cern.ch/record/2230422 |
| _version_ | 1780952601176571904 |
|---|---|
| author | Deshayes, Yannick Béchou, Laurent |
| author_facet | Deshayes, Yannick Béchou, Laurent |
| author_sort | Deshayes, Yannick |
| collection | CERN |
| id | cern-2230422 |
| institution | Organización Europea para la Investigación Nuclear |
| language | eng |
| publishDate | 2016 |
| publisher | Elsevier Science |
| record_format | invenio |
| spelling | cern-22304222021-04-21T19:26:48Zhttp://cds.cern.ch/record/2230422engDeshayes, YannickBéchou, LaurentReliability, robustness and failure mechanisms of LED devices: methodology and evaluationXXElsevier Scienceoai:cds.cern.ch:22304222016 |
| spellingShingle | XX Deshayes, Yannick Béchou, Laurent Reliability, robustness and failure mechanisms of LED devices: methodology and evaluation |
| title | Reliability, robustness and failure mechanisms of LED devices: methodology and evaluation |
| title_full | Reliability, robustness and failure mechanisms of LED devices: methodology and evaluation |
| title_fullStr | Reliability, robustness and failure mechanisms of LED devices: methodology and evaluation |
| title_full_unstemmed | Reliability, robustness and failure mechanisms of LED devices: methodology and evaluation |
| title_short | Reliability, robustness and failure mechanisms of LED devices: methodology and evaluation |
| title_sort | reliability, robustness and failure mechanisms of led devices: methodology and evaluation |
| topic | XX |
| url | http://cds.cern.ch/record/2230422 |
| work_keys_str_mv | AT deshayesyannick reliabilityrobustnessandfailuremechanismsofleddevicesmethodologyandevaluation AT bechoulaurent reliabilityrobustnessandfailuremechanismsofleddevicesmethodologyandevaluation |