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Reliability, robustness and failure mechanisms of LED devices: methodology and evaluation

Detalles Bibliográficos
Autores principales:	Deshayes, Yannick, Béchou, Laurent
Lenguaje:	eng
Publicado:	Elsevier Science 2016
Materias:	XX
Acceso en línea:	http://cds.cern.ch/record/2230422

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