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Beam test results of an ion-implanted capacitively coupled silicon strip detector processed on a 100 mm silicon wafer
| Autores principales: | , , , , , , , , , , , , , , , |
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| Lenguaje: | eng |
| Publicado: |
1991
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| Materias: | |
| Acceso en línea: | https://dx.doi.org/10.1016/0168-9002(91)91116-D http://cds.cern.ch/record/223900 |
| _version_ | 1780883469701742592 |
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| author | Hietanen, I Lindgren, J Orava, Risto Tuuva, T Brenner, R Andersson, M Leinonen, K Ronkainen, H Turala, Michal Weilhammer, Peter Dulinski, W Husson, D Lounis, A Schäffer, M Turchetta, R Chauveau, J |
| author_facet | Hietanen, I Lindgren, J Orava, Risto Tuuva, T Brenner, R Andersson, M Leinonen, K Ronkainen, H Turala, Michal Weilhammer, Peter Dulinski, W Husson, D Lounis, A Schäffer, M Turchetta, R Chauveau, J |
| author_sort | Hietanen, I |
| collection | CERN |
| id | cern-223900 |
| institution | Organización Europea para la Investigación Nuclear |
| language | eng |
| publishDate | 1991 |
| record_format | invenio |
| spelling | cern-2239002019-09-30T06:29:59Zdoi:10.1016/0168-9002(91)91116-Dhttp://cds.cern.ch/record/223900engHietanen, ILindgren, JOrava, RistoTuuva, TBrenner, RAndersson, MLeinonen, KRonkainen, HTurala, MichalWeilhammer, PeterDulinski, WHusson, DLounis, ASchäffer, MTurchetta, RChauveau, JBeam test results of an ion-implanted capacitively coupled silicon strip detector processed on a 100 mm silicon waferDetectors and Experimental TechniquesHU-SEFT-1991-15oai:cds.cern.ch:2239001991 |
| spellingShingle | Detectors and Experimental Techniques Hietanen, I Lindgren, J Orava, Risto Tuuva, T Brenner, R Andersson, M Leinonen, K Ronkainen, H Turala, Michal Weilhammer, Peter Dulinski, W Husson, D Lounis, A Schäffer, M Turchetta, R Chauveau, J Beam test results of an ion-implanted capacitively coupled silicon strip detector processed on a 100 mm silicon wafer |
| title | Beam test results of an ion-implanted capacitively coupled silicon strip detector processed on a 100 mm silicon wafer |
| title_full | Beam test results of an ion-implanted capacitively coupled silicon strip detector processed on a 100 mm silicon wafer |
| title_fullStr | Beam test results of an ion-implanted capacitively coupled silicon strip detector processed on a 100 mm silicon wafer |
| title_full_unstemmed | Beam test results of an ion-implanted capacitively coupled silicon strip detector processed on a 100 mm silicon wafer |
| title_short | Beam test results of an ion-implanted capacitively coupled silicon strip detector processed on a 100 mm silicon wafer |
| title_sort | beam test results of an ion-implanted capacitively coupled silicon strip detector processed on a 100 mm silicon wafer |
| topic | Detectors and Experimental Techniques |
| url | https://dx.doi.org/10.1016/0168-9002(91)91116-D http://cds.cern.ch/record/223900 |
| work_keys_str_mv | AT hietaneni beamtestresultsofanionimplantedcapacitivelycoupledsiliconstripdetectorprocessedona100mmsiliconwafer AT lindgrenj beamtestresultsofanionimplantedcapacitivelycoupledsiliconstripdetectorprocessedona100mmsiliconwafer AT oravaristo beamtestresultsofanionimplantedcapacitivelycoupledsiliconstripdetectorprocessedona100mmsiliconwafer AT tuuvat beamtestresultsofanionimplantedcapacitivelycoupledsiliconstripdetectorprocessedona100mmsiliconwafer AT brennerr beamtestresultsofanionimplantedcapacitivelycoupledsiliconstripdetectorprocessedona100mmsiliconwafer AT anderssonm beamtestresultsofanionimplantedcapacitivelycoupledsiliconstripdetectorprocessedona100mmsiliconwafer AT leinonenk beamtestresultsofanionimplantedcapacitivelycoupledsiliconstripdetectorprocessedona100mmsiliconwafer AT ronkainenh beamtestresultsofanionimplantedcapacitivelycoupledsiliconstripdetectorprocessedona100mmsiliconwafer AT turalamichal beamtestresultsofanionimplantedcapacitivelycoupledsiliconstripdetectorprocessedona100mmsiliconwafer AT weilhammerpeter beamtestresultsofanionimplantedcapacitivelycoupledsiliconstripdetectorprocessedona100mmsiliconwafer AT dulinskiw beamtestresultsofanionimplantedcapacitivelycoupledsiliconstripdetectorprocessedona100mmsiliconwafer AT hussond beamtestresultsofanionimplantedcapacitivelycoupledsiliconstripdetectorprocessedona100mmsiliconwafer AT lounisa beamtestresultsofanionimplantedcapacitivelycoupledsiliconstripdetectorprocessedona100mmsiliconwafer AT schafferm beamtestresultsofanionimplantedcapacitivelycoupledsiliconstripdetectorprocessedona100mmsiliconwafer AT turchettar beamtestresultsofanionimplantedcapacitivelycoupledsiliconstripdetectorprocessedona100mmsiliconwafer AT chauveauj beamtestresultsofanionimplantedcapacitivelycoupledsiliconstripdetectorprocessedona100mmsiliconwafer |