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Electromigration inside logic cells: modeling, analyzing and mitigating signal electromigration in nanoCMOS
This book describes new and effective methodologies for modeling, analyzing and mitigating cell-internal signal electromigration in nanoCMOS, with significant circuit lifetime improvements and no impact on performance, area and power. The authors are the first to analyze and propose a solution for t...
| Autores principales: | , , |
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| Lenguaje: | eng |
| Publicado: |
Springer
2017
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| Materias: | |
| Acceso en línea: | https://dx.doi.org/10.1007/978-3-319-48899-8 http://cds.cern.ch/record/2240495 |