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TID Tolerance of commercial 130nm CMOS Technologies for HEP experiments
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Lenguaje: | eng |
Publicado: |
2017
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Acceso en línea: | http://cds.cern.ch/record/2252791 |
_version_ | 1780953527731879936 |
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author | Gonella, Laura |
author_facet | Gonella, Laura |
author_sort | Gonella, Laura |
collection | CERN |
id | cern-2252791 |
institution | Organización Europea para la Investigación Nuclear |
language | eng |
publishDate | 2017 |
record_format | invenio |
spelling | cern-22527912019-09-30T06:29:59Zhttp://cds.cern.ch/record/2252791engGonella, LauraTID Tolerance of commercial 130nm CMOS Technologies for HEP experimentsDetectors and Experimental TechniquesCERN-THESIS-2006-150oai:cds.cern.ch:22527912017-02-18T15:08:59Z |
spellingShingle | Detectors and Experimental Techniques Gonella, Laura TID Tolerance of commercial 130nm CMOS Technologies for HEP experiments |
title | TID Tolerance of commercial 130nm CMOS Technologies for HEP experiments |
title_full | TID Tolerance of commercial 130nm CMOS Technologies for HEP experiments |
title_fullStr | TID Tolerance of commercial 130nm CMOS Technologies for HEP experiments |
title_full_unstemmed | TID Tolerance of commercial 130nm CMOS Technologies for HEP experiments |
title_short | TID Tolerance of commercial 130nm CMOS Technologies for HEP experiments |
title_sort | tid tolerance of commercial 130nm cmos technologies for hep experiments |
topic | Detectors and Experimental Techniques |
url | http://cds.cern.ch/record/2252791 |
work_keys_str_mv | AT gonellalaura tidtoleranceofcommercial130nmcmostechnologiesforhepexperiments |