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TID Tolerance of commercial 130nm CMOS Technologies for HEP experiments

Detalles Bibliográficos
Autor principal: Gonella, Laura
Lenguaje:eng
Publicado: 2017
Materias:
Acceso en línea:http://cds.cern.ch/record/2252791
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author Gonella, Laura
author_facet Gonella, Laura
author_sort Gonella, Laura
collection CERN
id cern-2252791
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2017
record_format invenio
spelling cern-22527912019-09-30T06:29:59Zhttp://cds.cern.ch/record/2252791engGonella, LauraTID Tolerance of commercial 130nm CMOS Technologies for HEP experimentsDetectors and Experimental TechniquesCERN-THESIS-2006-150oai:cds.cern.ch:22527912017-02-18T15:08:59Z
spellingShingle Detectors and Experimental Techniques
Gonella, Laura
TID Tolerance of commercial 130nm CMOS Technologies for HEP experiments
title TID Tolerance of commercial 130nm CMOS Technologies for HEP experiments
title_full TID Tolerance of commercial 130nm CMOS Technologies for HEP experiments
title_fullStr TID Tolerance of commercial 130nm CMOS Technologies for HEP experiments
title_full_unstemmed TID Tolerance of commercial 130nm CMOS Technologies for HEP experiments
title_short TID Tolerance of commercial 130nm CMOS Technologies for HEP experiments
title_sort tid tolerance of commercial 130nm cmos technologies for hep experiments
topic Detectors and Experimental Techniques
url http://cds.cern.ch/record/2252791
work_keys_str_mv AT gonellalaura tidtoleranceofcommercial130nmcmostechnologiesforhepexperiments