Measurements of neutron-induced effects in silicon detectors and MOS capacitors

Detalles Bibliográficos
Autores principales: Glaser, M, Lemeilleur, F, Occelli, E
Lenguaje:eng
Publicado: 1991
Materias:
Detectors and Experimental Techniques
Acceso en línea:http://cds.cern.ch/record/225604

Internet

http://cds.cern.ch/record/225604

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