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Measurements of neutron-induced effects in silicon detectors and MOS capacitors

Detalles Bibliográficos
Autores principales:	Glaser, M, Lemeilleur, F, Occelli, E
Lenguaje:	eng
Publicado:	1991
Materias:	Detectors and Experimental Techniques
Acceso en línea:	http://cds.cern.ch/record/225604

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