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On-wafer microwave measurements and de-embedding
Autor principal: | |
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Lenguaje: | eng |
Publicado: |
Artech House
2016
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Materias: | |
Acceso en línea: | http://cds.cern.ch/record/2264352 |
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author | Lourandakis, Errikos |
author_facet | Lourandakis, Errikos |
author_sort | Lourandakis, Errikos |
collection | CERN |
id | cern-2264352 |
institution | Organización Europea para la Investigación Nuclear |
language | eng |
publishDate | 2016 |
publisher | Artech House |
record_format | invenio |
spelling | cern-22643522021-04-21T19:13:06Zhttp://cds.cern.ch/record/2264352engLourandakis, ErrikosOn-wafer microwave measurements and de-embeddingEngineeringArtech Houseoai:cds.cern.ch:22643522016 |
spellingShingle | Engineering Lourandakis, Errikos On-wafer microwave measurements and de-embedding |
title | On-wafer microwave measurements and de-embedding |
title_full | On-wafer microwave measurements and de-embedding |
title_fullStr | On-wafer microwave measurements and de-embedding |
title_full_unstemmed | On-wafer microwave measurements and de-embedding |
title_short | On-wafer microwave measurements and de-embedding |
title_sort | on-wafer microwave measurements and de-embedding |
topic | Engineering |
url | http://cds.cern.ch/record/2264352 |
work_keys_str_mv | AT lourandakiserrikos onwafermicrowavemeasurementsanddeembedding |