Investigation of post processing resistivity modification for HV-CMOS pixel detectors

Detalles Bibliográficos
Autores principales: Holmkvist, William, Muenstermann, Daniel
Formato: info:eu-repo/semantics/article
Lenguaje:eng
Publicado: 2017
Materias:
Detectors and Experimental Techniques
6: Novel high voltage and resistive CMOS sensors
Acceso en línea:http://cds.cern.ch/record/2273904

Internet

http://cds.cern.ch/record/2273904

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