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Investigation of post processing resistivity modification for HV-CMOS pixel detectors

Detalles Bibliográficos
Autores principales:	Holmkvist, William, Muenstermann, Daniel
Formato:	info:eu-repo/semantics/article
Lenguaje:	eng
Publicado:	2017
Materias:	Detectors and Experimental Techniques 6: Novel high voltage and resistive CMOS sensors
Acceso en línea:	http://cds.cern.ch/record/2273904

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