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Next generation HALT and HASS: robust design of electronics and systems
| Autores principales: | , |
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| Lenguaje: | eng |
| Publicado: |
John Wiley & Sons
2016
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| Materias: | |
| Acceso en línea: | http://cds.cern.ch/record/2279317 |
| _version_ | 1780955419868397568 |
|---|---|
| author | Gray, Kirk A Paschkewitz, John J |
| author_facet | Gray, Kirk A Paschkewitz, John J |
| author_sort | Gray, Kirk A |
| collection | CERN |
| id | cern-2279317 |
| institution | Organización Europea para la Investigación Nuclear |
| language | eng |
| publishDate | 2016 |
| publisher | John Wiley & Sons |
| record_format | invenio |
| spelling | cern-22793172021-04-21T19:06:38Zhttp://cds.cern.ch/record/2279317engGray, Kirk APaschkewitz, John JNext generation HALT and HASS: robust design of electronics and systemsEngineeringJohn Wiley & Sonsoai:cds.cern.ch:22793172016 |
| spellingShingle | Engineering Gray, Kirk A Paschkewitz, John J Next generation HALT and HASS: robust design of electronics and systems |
| title | Next generation HALT and HASS: robust design of electronics and systems |
| title_full | Next generation HALT and HASS: robust design of electronics and systems |
| title_fullStr | Next generation HALT and HASS: robust design of electronics and systems |
| title_full_unstemmed | Next generation HALT and HASS: robust design of electronics and systems |
| title_short | Next generation HALT and HASS: robust design of electronics and systems |
| title_sort | next generation halt and hass: robust design of electronics and systems |
| topic | Engineering |
| url | http://cds.cern.ch/record/2279317 |
| work_keys_str_mv | AT graykirka nextgenerationhaltandhassrobustdesignofelectronicsandsystems AT paschkewitzjohnj nextgenerationhaltandhassrobustdesignofelectronicsandsystems |