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Next generation HALT and HASS: robust design of electronics and systems

Detalles Bibliográficos
Autores principales:	Gray, Kirk A, Paschkewitz, John J
Lenguaje:	eng
Publicado:	John Wiley & Sons 2016
Materias:	Engineering
Acceso en línea:	http://cds.cern.ch/record/2279317

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