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Impact of thermal and intermediate energy neutrons on the semiconductor memories for the CERN accelerators
A wide quantity of SRAM memories are employed along the Large Hadron Collider (LHC), the main CERN accelerator, and they are subjected to high levels of ionizing radiations which compromise the reliability of these devices. The Single Event Effect (SEE) qualification for components to be used in the...
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| Lenguaje: | eng |
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2017
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| Acceso en línea: | http://cds.cern.ch/record/2282268 |