Minimum bias and underlying event measurements at CMS

Recent minimum bias and underlying event measurements will be presented.

Detalles Bibliográficos
Autor principal: Cerci, Salim
Lenguaje:eng
Publicado: 2017
Materias:
Detectors and Experimental Techniques
Acceso en línea:http://cds.cern.ch/record/2287362

Internet

http://cds.cern.ch/record/2287362

Ejemplares similares