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Minimum bias and underlying event measurements at CMS

Recent minimum bias and underlying event measurements will be presented.

Detalles Bibliográficos
Autor principal:	Cerci, Salim
Lenguaje:	eng
Publicado:	2017
Materias:	Detectors and Experimental Techniques
Acceso en línea:	http://cds.cern.ch/record/2287362

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