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Measurement techniques for radio frequency nanoelectronics

Connect basic theory with real-world applications with this practical, cross-disciplinary guide to radio frequency measurement of nanoscale devices and materials.• Learn the techniques needed for characterizing the performance of devices and their constituent building blocks, including semiconductin...

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Detalles Bibliográficos
Autores principales: Wallis, T Mitch, Kabos, Pavel
Lenguaje:eng
Publicado: Cambridge University Press 2017
Materias:
Acceso en línea:https://dx.doi.org/10.1017/9781316343098
http://cds.cern.ch/record/2289071