Cargando…

Measurement techniques for radio frequency nanoelectronics

Connect basic theory with real-world applications with this practical, cross-disciplinary guide to radio frequency measurement of nanoscale devices and materials.• Learn the techniques needed for characterizing the performance of devices and their constituent building blocks, including semiconductin...

Descripción completa

Detalles Bibliográficos
Autores principales: Wallis, T Mitch, Kabos, Pavel
Lenguaje:eng
Publicado: Cambridge University Press 2017
Materias:
Acceso en línea:https://dx.doi.org/10.1017/9781316343098
http://cds.cern.ch/record/2289071
_version_ 1780956244374192128
author Wallis, T Mitch
Kabos, Pavel
author_facet Wallis, T Mitch
Kabos, Pavel
author_sort Wallis, T Mitch
collection CERN
description Connect basic theory with real-world applications with this practical, cross-disciplinary guide to radio frequency measurement of nanoscale devices and materials.• Learn the techniques needed for characterizing the performance of devices and their constituent building blocks, including semiconducting nanowires, graphene, and other two dimensional materials such as transition metal dichalcogenides• Gain practical insights into instrumentation, including on-wafer measurement platforms and scanning microwave microscopy• Discover how measurement techniques can be applied to solve real-world problems, in areas such as passive and active nanoelectronic devices, semiconductor dopant profiling, subsurface nanoscale tomography, nanoscale magnetic device engineering, and broadband, spatially localized measurements of biological materialsFeaturing numerous practical examples, and written in a concise yet rigorous style, this is the ideal resource for researchers, practicing engineers, and graduate students new to the field of radio frequency nanoelectronics.
id cern-2289071
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2017
publisher Cambridge University Press
record_format invenio
spelling cern-22890712021-04-21T19:01:55Zdoi:10.1017/9781316343098http://cds.cern.ch/record/2289071engWallis, T MitchKabos, PavelMeasurement techniques for radio frequency nanoelectronicsOther Fields of PhysicsConnect basic theory with real-world applications with this practical, cross-disciplinary guide to radio frequency measurement of nanoscale devices and materials.• Learn the techniques needed for characterizing the performance of devices and their constituent building blocks, including semiconducting nanowires, graphene, and other two dimensional materials such as transition metal dichalcogenides• Gain practical insights into instrumentation, including on-wafer measurement platforms and scanning microwave microscopy• Discover how measurement techniques can be applied to solve real-world problems, in areas such as passive and active nanoelectronic devices, semiconductor dopant profiling, subsurface nanoscale tomography, nanoscale magnetic device engineering, and broadband, spatially localized measurements of biological materialsFeaturing numerous practical examples, and written in a concise yet rigorous style, this is the ideal resource for researchers, practicing engineers, and graduate students new to the field of radio frequency nanoelectronics.Cambridge University Pressoai:cds.cern.ch:22890712017
spellingShingle Other Fields of Physics
Wallis, T Mitch
Kabos, Pavel
Measurement techniques for radio frequency nanoelectronics
title Measurement techniques for radio frequency nanoelectronics
title_full Measurement techniques for radio frequency nanoelectronics
title_fullStr Measurement techniques for radio frequency nanoelectronics
title_full_unstemmed Measurement techniques for radio frequency nanoelectronics
title_short Measurement techniques for radio frequency nanoelectronics
title_sort measurement techniques for radio frequency nanoelectronics
topic Other Fields of Physics
url https://dx.doi.org/10.1017/9781316343098
http://cds.cern.ch/record/2289071
work_keys_str_mv AT wallistmitch measurementtechniquesforradiofrequencynanoelectronics
AT kabospavel measurementtechniquesforradiofrequencynanoelectronics