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Measurement techniques for radio frequency nanoelectronics
Connect basic theory with real-world applications with this practical, cross-disciplinary guide to radio frequency measurement of nanoscale devices and materials.• Learn the techniques needed for characterizing the performance of devices and their constituent building blocks, including semiconductin...
Autores principales: | , |
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Lenguaje: | eng |
Publicado: |
Cambridge University Press
2017
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Materias: | |
Acceso en línea: | https://dx.doi.org/10.1017/9781316343098 http://cds.cern.ch/record/2289071 |
_version_ | 1780956244374192128 |
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author | Wallis, T Mitch Kabos, Pavel |
author_facet | Wallis, T Mitch Kabos, Pavel |
author_sort | Wallis, T Mitch |
collection | CERN |
description | Connect basic theory with real-world applications with this practical, cross-disciplinary guide to radio frequency measurement of nanoscale devices and materials.• Learn the techniques needed for characterizing the performance of devices and their constituent building blocks, including semiconducting nanowires, graphene, and other two dimensional materials such as transition metal dichalcogenides• Gain practical insights into instrumentation, including on-wafer measurement platforms and scanning microwave microscopy• Discover how measurement techniques can be applied to solve real-world problems, in areas such as passive and active nanoelectronic devices, semiconductor dopant profiling, subsurface nanoscale tomography, nanoscale magnetic device engineering, and broadband, spatially localized measurements of biological materialsFeaturing numerous practical examples, and written in a concise yet rigorous style, this is the ideal resource for researchers, practicing engineers, and graduate students new to the field of radio frequency nanoelectronics. |
id | cern-2289071 |
institution | Organización Europea para la Investigación Nuclear |
language | eng |
publishDate | 2017 |
publisher | Cambridge University Press |
record_format | invenio |
spelling | cern-22890712021-04-21T19:01:55Zdoi:10.1017/9781316343098http://cds.cern.ch/record/2289071engWallis, T MitchKabos, PavelMeasurement techniques for radio frequency nanoelectronicsOther Fields of PhysicsConnect basic theory with real-world applications with this practical, cross-disciplinary guide to radio frequency measurement of nanoscale devices and materials.• Learn the techniques needed for characterizing the performance of devices and their constituent building blocks, including semiconducting nanowires, graphene, and other two dimensional materials such as transition metal dichalcogenides• Gain practical insights into instrumentation, including on-wafer measurement platforms and scanning microwave microscopy• Discover how measurement techniques can be applied to solve real-world problems, in areas such as passive and active nanoelectronic devices, semiconductor dopant profiling, subsurface nanoscale tomography, nanoscale magnetic device engineering, and broadband, spatially localized measurements of biological materialsFeaturing numerous practical examples, and written in a concise yet rigorous style, this is the ideal resource for researchers, practicing engineers, and graduate students new to the field of radio frequency nanoelectronics.Cambridge University Pressoai:cds.cern.ch:22890712017 |
spellingShingle | Other Fields of Physics Wallis, T Mitch Kabos, Pavel Measurement techniques for radio frequency nanoelectronics |
title | Measurement techniques for radio frequency nanoelectronics |
title_full | Measurement techniques for radio frequency nanoelectronics |
title_fullStr | Measurement techniques for radio frequency nanoelectronics |
title_full_unstemmed | Measurement techniques for radio frequency nanoelectronics |
title_short | Measurement techniques for radio frequency nanoelectronics |
title_sort | measurement techniques for radio frequency nanoelectronics |
topic | Other Fields of Physics |
url | https://dx.doi.org/10.1017/9781316343098 http://cds.cern.ch/record/2289071 |
work_keys_str_mv | AT wallistmitch measurementtechniquesforradiofrequencynanoelectronics AT kabospavel measurementtechniquesforradiofrequencynanoelectronics |