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Measurement techniques for radio frequency nanoelectronics
Connect basic theory with real-world applications with this practical, cross-disciplinary guide to radio frequency measurement of nanoscale devices and materials.• Learn the techniques needed for characterizing the performance of devices and their constituent building blocks, including semiconductin...
Autores principales: | Wallis, T Mitch, Kabos, Pavel |
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Lenguaje: | eng |
Publicado: |
Cambridge University Press
2017
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Materias: | |
Acceso en línea: | https://dx.doi.org/10.1017/9781316343098 http://cds.cern.ch/record/2289071 |
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