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Theory of intense beams of charged particles
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at hig...
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| Lenguaje: | eng |
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Elsevier Science & Technology
2011
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| Acceso en línea: | http://cds.cern.ch/record/2317540 |