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US-Japan Seminar on Surface Characterization by Electron Diffraction, Reflection Electron Microscopy and Holography
| Autores principales: | , |
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| Lenguaje: | eng |
| Publicado: |
1993
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| Materias: | |
| Acceso en línea: | http://cds.cern.ch/record/258311 |
| _version_ | 1780885957032017920 |
|---|---|
| author | Cohen, P I Ichimiya, A |
| author_facet | Cohen, P I Ichimiya, A |
| author_sort | Cohen, P I |
| collection | CERN |
| id | cern-258311 |
| institution | Organización Europea para la Investigación Nuclear |
| language | eng |
| publishDate | 1993 |
| record_format | invenio |
| spelling | cern-2583112021-04-22T21:30:27Zhttp://cds.cern.ch/record/258311engCohen, P IIchimiya, AUS-Japan Seminar on Surface Characterization by Electron Diffraction, Reflection Electron Microscopy and HolographyAccelerators and Storage Ringsoai:cds.cern.ch:2583111993 |
| spellingShingle | Accelerators and Storage Rings Cohen, P I Ichimiya, A US-Japan Seminar on Surface Characterization by Electron Diffraction, Reflection Electron Microscopy and Holography |
| title | US-Japan Seminar on Surface Characterization by Electron Diffraction, Reflection Electron Microscopy and Holography |
| title_full | US-Japan Seminar on Surface Characterization by Electron Diffraction, Reflection Electron Microscopy and Holography |
| title_fullStr | US-Japan Seminar on Surface Characterization by Electron Diffraction, Reflection Electron Microscopy and Holography |
| title_full_unstemmed | US-Japan Seminar on Surface Characterization by Electron Diffraction, Reflection Electron Microscopy and Holography |
| title_short | US-Japan Seminar on Surface Characterization by Electron Diffraction, Reflection Electron Microscopy and Holography |
| title_sort | us-japan seminar on surface characterization by electron diffraction, reflection electron microscopy and holography |
| topic | Accelerators and Storage Rings |
| url | http://cds.cern.ch/record/258311 |
| work_keys_str_mv | AT cohenpi usjapanseminaronsurfacecharacterizationbyelectrondiffractionreflectionelectronmicroscopyandholography AT ichimiyaa usjapanseminaronsurfacecharacterizationbyelectrondiffractionreflectionelectronmicroscopyandholography |